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SEPL: Smart evicted page list buffer for NAND flash storage system

Authors
Jin, XinJung, SanghyukSong, Yong Ho
Issue Date
Sep-2010
Publisher
IEEE
Keywords
Buffer cache; Long-term; Metadata; NAND flash; Random access; Replacement; Storage system; Write intensive
Citation
Proceedings - 10th IEEE International Conference on Computer and Information Technology, CIT-2010, 7th IEEE International Conference on Embedded Software and Systems, ICESS-2010, ScalCom-2010, pp.1687 - 1694
Indexed
SCOPUS
Journal Title
Proceedings - 10th IEEE International Conference on Computer and Information Technology, CIT-2010, 7th IEEE International Conference on Embedded Software and Systems, ICESS-2010, ScalCom-2010
Start Page
1687
End Page
1694
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/173715
DOI
10.1109/CIT.2010.297
ISSN
0000-0000
Abstract
NAND flash memory has become popular in the consumer market while its success in main storage market is still limited. One of the reasons is that NAND flash suffers severe performance degradation under random write requests, and these requests are inevitable since the complexity of the applications is growing rapidly. One way to mitigate the problem is by applying DRAM as the buffer between host and NAND flash to absorb these requests, and numbers of buffer management schemes such as CFLRU and FARS had been proposed. However, these algorithms do not respect write intensive and long-term pages enough. In this paper, we propose a buffer replacement algorithm with a smart eviction list and a brand new eviction criterion that helps retaining the write intensive pages in the buffer in order to lower down the number of write request into NAND flash memory. Experiments show that SEPL outperforms other algorithms in the traces where random access is dominant.
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서울 공과대학 (서울 융합전자공학부)
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