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Reproducible unipolar resistive switching behaviors in the metal-deficient CoOx thin film

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dc.contributor.authorKwak, June Sik-
dc.contributor.authorDo, Young Ho-
dc.contributor.authorBae, Yoon Cheol-
dc.contributor.authorIm, Hyunsik-
dc.contributor.authorHong, Jin Pyo-
dc.date.accessioned2022-12-20T15:48:54Z-
dc.date.available2022-12-20T15:48:54Z-
dc.date.created2022-08-27-
dc.date.issued2010-09-
dc.identifier.issn0040-6090-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174146-
dc.description.abstractPt/CoOx/Pt tri-layers exhibited reproducible and stable unipolar switching under a dc sweeping voltage. In order to investigate the role of oxygen reduction in the metal-deficient CoOx layer, resistive switching of the post-annealed CoOx thin film was compared with those of the as-deposited CoO thin film. X-ray photoemission spectroscopy showed larger reproducible resistance switching and decreasing of current level in the post-annealed CoO thin film. This may be explained by a reduction in oxygen stoichiometry without phase transformation of the CoOx. In addition, stable switching in post-annealed CoOx layer is considered to originate from the decrease of the Co vacancies in local Co3O4 region partially distributed in the whole CoOx layer, not in the dominant CoO.-
dc.language영어-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.titleReproducible unipolar resistive switching behaviors in the metal-deficient CoOx thin film-
dc.typeArticle-
dc.contributor.affiliatedAuthorHong, Jin Pyo-
dc.identifier.doi10.1016/j.tsf.2010.03.050-
dc.identifier.scopusid2-s2.0-77956062166-
dc.identifier.wosid000282242600065-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.518, no.22, pp.6437 - 6440-
dc.relation.isPartOfTHIN SOLID FILMS-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume518-
dc.citation.number22-
dc.citation.startPage6437-
dc.citation.endPage6440-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordAuthorCoOx-
dc.subject.keywordAuthorResistive switching-
dc.subject.keywordAuthorNonvolatile memory-
dc.subject.keywordAuthorReRAM-
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0040609010003548?via%3Dihub-
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