Path-percolation Modeling of the Electrical Property Variations with Statistical Procedures in Spatially-disordered Inhomogeneous Media

Abstract

A current-path percolation model has been developed to simulate the electrical property variations ill spatially-disordered inhomogeneous media by establishing a computational path determination scheme. i.e., a cluster labeling process. This scheme eliminates the necessity to estimate the bond resistance at lattice edges. Subsequently, an active clustering process provides more accurate effective electrical resistance values than both the effective medium approximation (EMA) and the Kirkpatrick algorithm. We apply the present model to a solid thin film mixture of temperature-dependent resistive materials. The computational results agree well with experimental data for the effective resistance of pure phases Of VO(2) in the literature. Results show that the electrical resistance Of VO(2) thin films is rather strongly affected by the micro- or the nano-structural configurations of the conductive materials of the thin films. It is expected that current-path percolation modeling combined with a cluster labeling process call be applied to investigating the effective electrical properties of conductive materials and call be utilized as a reverse engineering tool to tailor the micro- or the nano-structural properties of conductive materials.