Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Sung Hwan | - |
dc.contributor.author | Kim, Won Tae | - |
dc.contributor.author | Jung, Jae Hun | - |
dc.contributor.author | Kim, Tae Whan | - |
dc.contributor.author | Yoon, Chong Seung | - |
dc.contributor.author | Kim, Young-Ho | - |
dc.date.accessioned | 2022-12-20T19:16:36Z | - |
dc.date.available | 2022-12-20T19:16:36Z | - |
dc.date.created | 2022-08-27 | - |
dc.date.issued | 2010-01 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/175562 | - |
dc.description.abstract | Current-voltage (I-V) measurements on Al/Ni1-xFex nanoparticles embedded in polyimide/Al devices at 300 K showed a current bistability due to the existence of Ni1-xFex nanoparticles. The ON/OFF current ratio for the fabricated devices was about 10(2). The retention time data of the devices demonstrated charge trapping and detrapping processes. Carrier transport mechanisms of the devices are described on the basis of the I-V experimental and fitting results. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Tae Whan | - |
dc.contributor.affiliatedAuthor | Yoon, Chong Seung | - |
dc.contributor.affiliatedAuthor | Kim, Young-Ho | - |
dc.identifier.doi | 10.1143/JJAP.49.01AD03 | - |
dc.identifier.scopusid | 2-s2.0-77950847026 | - |
dc.identifier.wosid | 000279288900024 | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.1, pp.1 - 4 | - |
dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 49 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 4 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | CONJUGATED POLYMER | - |
dc.subject.keywordPlus | MEMORY DEVICE | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | SYSTEM | - |
dc.subject.keywordPlus | OXIDE | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.49.01AD03 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1365
COPYRIGHT © 2021 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.