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Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer
- Issue Date
- Jan-2010
- Publisher
- IOP PUBLISHING LTD
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.1, pp.1 - 4
- Indexed
- SCIE
SCOPUS
- Journal Title
- JAPANESE JOURNAL OF APPLIED PHYSICS
- Volume
- 49
- Number
- 1
- Start Page
- 1
- End Page
- 4
- ISSN
- 0021-4922
- Abstract
- Current-voltage (I-V) measurements on Al/Ni1-xFex nanoparticles embedded in polyimide/Al devices at 300 K showed a current bistability due to the existence of Ni1-xFex nanoparticles. The ON/OFF current ratio for the fabricated devices was about 10(2). The retention time data of the devices demonstrated charge trapping and detrapping processes. Carrier transport mechanisms of the devices are described on the basis of the I-V experimental and fitting results.
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Related Researcher
- Yoon, Chong Seung
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)