Cited 0 time in
Study of the electrical enhancement of direct-patternable Ag-nanostructures embedded SnO2 thin films prepared by photochemical metal-organic deposition
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Hyeong-Ho | - |
| dc.contributor.author | Zhang, Xin | - |
| dc.contributor.author | Kim, Hyuncheol | - |
| dc.contributor.author | Park, Jongchul | - |
| dc.contributor.author | Park, Hyung-Ho | - |
| dc.contributor.author | Chang, Ho Jung | - |
| dc.contributor.author | Jeon, Hyeongtag | - |
| dc.contributor.author | Hill, Ross H. | - |
| dc.date.accessioned | 2022-12-20T22:22:57Z | - |
| dc.date.available | 2022-12-20T22:22:57Z | - |
| dc.date.issued | 2009-05 | - |
| dc.identifier.issn | 1882-0743 | - |
| dc.identifier.issn | 1348-6535 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176828 | - |
| dc.description.abstract | In this study, we characterized the optical and electric properties of direct-patternable SnO2 films with embedded Ag nanorods/nanowires prepared by photochemical metal-organic deposition using photosensitive precursors. SnO2 films showed a random orientation of growth independent on the presence of Ag nanorods/nanowires and annealing temperature. The values for sheet resistance and average transmittance of the SnO2 films with and without Ag nanorods/nanowires after annealing at 600 degrees C were 6 k Omega/square and 82.2%, and 418 k Omega/square and 87.2%, respectively. Due to the incorporation of Ag nanorods/nanowires into the SnO2 films, the sheet resistance was remarkably improved, but the optical transmittance was slightly decreased. These results and the direct-patternability of photochemical deposition suggest that SnO2 films with embedded Ag nanorods/nanowires could easily be used in transparent electrodes, eliminating the need for high cost processes such as dry etching. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | Study of the electrical enhancement of direct-patternable Ag-nanostructures embedded SnO2 thin films prepared by photochemical metal-organic deposition | - |
| dc.type | Article | - |
| dc.publisher.location | 일본 | - |
| dc.identifier.doi | 10.2109/jcersj2.117.608 | - |
| dc.identifier.scopusid | 2-s2.0-67649372879 | - |
| dc.identifier.wosid | 000266254700016 | - |
| dc.identifier.bibliographicCitation | Journal of the Ceramic Society of Japan, v.117, no.1365, pp 608 - 611 | - |
| dc.citation.title | Journal of the Ceramic Society of Japan | - |
| dc.citation.volume | 117 | - |
| dc.citation.number | 1365 | - |
| dc.citation.startPage | 608 | - |
| dc.citation.endPage | 611 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
| dc.subject.keywordPlus | FERROELECTRIC PROPERTIES | - |
| dc.subject.keywordPlus | SPRAY-PYROLYSIS | - |
| dc.subject.keywordPlus | TRANSPARENT | - |
| dc.subject.keywordPlus | NANOPARTICLES | - |
| dc.subject.keywordPlus | NANOWIRES | - |
| dc.subject.keywordPlus | SURFACE | - |
| dc.subject.keywordAuthor | Metals | - |
| dc.subject.keywordAuthor | Oxides | - |
| dc.subject.keywordAuthor | Nanostructures | - |
| dc.subject.keywordAuthor | Chemical synthesis | - |
| dc.subject.keywordAuthor | Electrical properties | - |
| dc.identifier.url | https://www.jstage.jst.go.jp/article/jcersj2/117/1365/117_1365_608/_article | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
