Implementation of a Position Error Signal for Scanning Probe Microscopy-Based Data Storage Systems
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Choong Woo | - |
dc.contributor.author | Chung, Chung-Choo | - |
dc.contributor.author | Jin, Won-Hyeog | - |
dc.date.accessioned | 2022-12-20T22:24:38Z | - |
dc.date.available | 2022-12-20T22:24:38Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2009-05 | - |
dc.identifier.issn | 0018-9464 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176847 | - |
dc.description.abstract | In this paper, we propose a method of position error signal (PES) generation for read-only-memory (ROM) type scanning probe microscopy (SPM)-based data storage (SDS) systems. Conventionally, PES is generated by using servo bursts similar to those of hard disk drives. Recently, it was reported that stripe patterned media enables the generation of PES without using servo bursts as hard disk drives. In this paper, we report the fabrication of patterned media and its experimental results. Servo patterns are nano-imprinted on polymer medium film. We succeed in reading data and the servo patterns with a 1 x 3 cantilever. We also demonstrate track follow control with the PIES of the ROM type SDS through simulations. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Implementation of a Position Error Signal for Scanning Probe Microscopy-Based Data Storage Systems | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Chung, Chung-Choo | - |
dc.identifier.doi | 10.1109/TMAG.2009.2016497 | - |
dc.identifier.scopusid | 2-s2.0-65349132377 | - |
dc.identifier.wosid | 000265713500037 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON MAGNETICS, v.45, no.5, pp.2324 - 2327 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON MAGNETICS | - |
dc.citation.title | IEEE TRANSACTIONS ON MAGNETICS | - |
dc.citation.volume | 45 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 2324 | - |
dc.citation.endPage | 2327 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | MILLIPEDE | - |
dc.subject.keywordAuthor | Position error signal | - |
dc.subject.keywordAuthor | scanning probe microscopy | - |
dc.subject.keywordAuthor | SPM-based data storage | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4815971 | - |
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