Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Implementation of a Position Error Signal for Scanning Probe Microscopy-Based Data Storage Systems

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Choong Woo-
dc.contributor.authorChung, Chung-Choo-
dc.contributor.authorJin, Won-Hyeog-
dc.date.accessioned2022-12-20T22:24:38Z-
dc.date.available2022-12-20T22:24:38Z-
dc.date.created2022-08-26-
dc.date.issued2009-05-
dc.identifier.issn0018-9464-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176847-
dc.description.abstractIn this paper, we propose a method of position error signal (PES) generation for read-only-memory (ROM) type scanning probe microscopy (SPM)-based data storage (SDS) systems. Conventionally, PES is generated by using servo bursts similar to those of hard disk drives. Recently, it was reported that stripe patterned media enables the generation of PES without using servo bursts as hard disk drives. In this paper, we report the fabrication of patterned media and its experimental results. Servo patterns are nano-imprinted on polymer medium film. We succeed in reading data and the servo patterns with a 1 x 3 cantilever. We also demonstrate track follow control with the PIES of the ROM type SDS through simulations.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleImplementation of a Position Error Signal for Scanning Probe Microscopy-Based Data Storage Systems-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Chung-Choo-
dc.identifier.doi10.1109/TMAG.2009.2016497-
dc.identifier.scopusid2-s2.0-65349132377-
dc.identifier.wosid000265713500037-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MAGNETICS, v.45, no.5, pp.2324 - 2327-
dc.relation.isPartOfIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.titleIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.volume45-
dc.citation.number5-
dc.citation.startPage2324-
dc.citation.endPage2327-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusMILLIPEDE-
dc.subject.keywordAuthorPosition error signal-
dc.subject.keywordAuthorscanning probe microscopy-
dc.subject.keywordAuthorSPM-based data storage-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/4815971-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 전기공학전공 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Chung, Chung Choo photo

Chung, Chung Choo
COLLEGE OF ENGINEERING (MAJOR IN ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE