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Nano-floating gate capacitor with SnO2 quantum dots distributed in polyimide dielectrics

Authors
Lee, Dong UkSeo, Ki BongHan, Seung JongKim, Eun KyuKim, Young-Ho
Issue Date
Apr-2009
Publisher
John Wiley & Sons Ltd.
Citation
Physica Status Solidi (B): Basic Research, v.246, no.4, pp 893 - 896
Pages
4
Indexed
SCIE
SCOPUS
Journal Title
Physica Status Solidi (B): Basic Research
Volume
246
Number
4
Start Page
893
End Page
896
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176971
DOI
10.1002/pssb.200880617
ISSN
0370-1972
1521-3951
Abstract
Self assembled SnO2 quantum dots were fabricated by a chemical process between a BPDA PDA polyamic acid and a Sn film. A nano-floating gate capacitor having metal insulator semiconductor structure has been formed on p-type Si substrate with SnO2 quantum dots and dielectric polymer layer. The size and density of fabricated SnO2 quantum dot were about 15 nm and 2.4x10(11)cm(2), respectively. The electrical properties of the nano floating gate capacitor have been investigated by measuring capacitance-voltage charactersitcs. Then the flat band voltage shift due to charging of the electron in SnO2 quantum dot was ranged from 1.2 V to 4 V. And the transmission electron microscopy and the optical absorption spectra have been measured to investigage the morphology and absorbance of the SnO2 quantum dots embedded in polymide.
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서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles
서울 자연과학대학 > 서울 물리학과 > 1. Journal Articles

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