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Applications of Soft X-ray Spectromicroscopy in Material and Environmental Sciences

Authors
Yoon, Tae Hyun
Issue Date
Feb-2009
Publisher
TAYLOR & FRANCIS INC
Keywords
Soft X-ray spectromicroscopy; STXM; chemical imaging; NEXAFS; synchrotron-based X-ray techniques
Citation
APPLIED SPECTROSCOPY REVIEWS, v.44, no.2, pp.91 - 122
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SPECTROSCOPY REVIEWS
Volume
44
Number
2
Start Page
91
End Page
122
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177266
DOI
10.1080/05704920802352531
ISSN
0570-4928
Abstract
In soft X-ray spectromicroscopy, significant advances were made during last few decades, as a result of improvements in X-ray optics and greater availability of third-generation synchrotron sources. These advancements made this spectromicroscopic technique as one of the important analytical tools in several scientific disciplines (e.g., environmental and material sciences), since nanometer-scale chemical information under in situ conditions, which has not previously been available from other tools, can be obtained using this technique. Therefore, an increasing number of applications for imaging and quantification of chemically distinct components in a wide range of specimens, such as fully hydrated environmental and biological specimens, polymer composite materials with nanostructures, and novel nanomaterials is being reported. In this review, recent developments and applications of soft X-ray spectromicroscopy, with focus on scanning transmission X-ray microscopy (STXM), are described. Brief descriptions of the basic principles and generic instrumental setups of soft X-ray spectromicroscopy will be followed by various recent application examples of soft X-ray spectromicroscopy in material science, environmental science, etc., where knowledge of the heterogeneous distributions of chemical species and elemental compositions is considered important in understanding and explaining phenomena in each scientific disciplines.
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