Fabrication of n-type Schottky barrier thin-film transistor with channel length and width of 0.1 mu m and erbium silicide source/drain
- Authors
- Yang, Jong-Heon; Ahn, Chang-Geun; Baek, In-Bok; Jang, Moon-Gyu; Sung, Gun Yong; Park, Byung-Chul; Im, Kiju; Lee, Seongjae
- Issue Date
- Jan-2009
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Schottky barrier; Low temperature poly-Si; Thin-film transistor; SB TFT; Erbium silicide; 3D integration
- Citation
- THIN SOLID FILMS, v.517, no.5, pp.1825 - 1828
- Indexed
- SCIE
SCOPUS
- Journal Title
- THIN SOLID FILMS
- Volume
- 517
- Number
- 5
- Start Page
- 1825
- End Page
- 1828
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177377
- DOI
- 10.1016/j.tsf.2008.09.072
- ISSN
- 0040-6090
- Abstract
- In this paper, a Schottky barrier polycrystalline silicon thin-film transistor (SB TFT) with erbium silicide source/drain is demonstrated using low temperature processes. A low temperature oxide is used for a gate dielectric and the transistor channel is crystallized by a metal-induced lateral crystallization process. An n-type SB TFT shows a normal electrical performance with subthreshold slope of 239 mV/dec, I-ON/I-OFF ratio of 5.8 x 10(4) and I-ON of 2 mu A/mu m at V-G=3 V, V-D = 2.5 V for 0.1 mu m device. A process temperature is maintained at less than 600 degrees C throughout the whole processes. The SB TFT is expected to be a promising candidate for a next system-on-glass technology and an alternative 3D integration technology.
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