Scaling of Defect Domain by Reverse Twist in Chiral Hybrid In-Plane Switching LC Mode

Abstract

We proposed a new Liquid Crystal (LC) mode named as chiral hybrid in-plane switching (CH-IPS) LC mode for LCD application. However, when LC is injected into a CH-IPS sample, the domains by reverse twist are induced usually. In order to remove such a defect, we investigate what the major factors which have influence on the creation of defects by the reverse twist domain are. By experiment, we define the major factors which have large influence on the formation of domains. By controlling these major factors properly, we can remove defect domains perfectly.