Electrostatic force microscopy measurements of charge trapping behavior of Au nanoparticles embedded in metal-insulator-semiconductor structure
DC Field | Value | Language |
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dc.contributor.author | Yang, JungYup | - |
dc.contributor.author | Kim, JooHyung | - |
dc.contributor.author | Lee, JunSeok | - |
dc.contributor.author | Min, SeungKi | - |
dc.contributor.author | Kim, HyunJung | - |
dc.contributor.author | Wang, Kang L. | - |
dc.contributor.author | Hong, JinPyo | - |
dc.date.accessioned | 2022-12-21T01:23:50Z | - |
dc.date.available | 2022-12-21T01:23:50Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2008-09 | - |
dc.identifier.issn | 0304-3991 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177959 | - |
dc.description.abstract | Charge trapping properties of electrons and holes in ALL nanoparticles embedded in metal-insulator-semiconductor (MIS) on p-type Si (10 0) substrates were investigated by electrostatic force microscopy (EFM). The ALL nanoparticles were prepared with a unique laser irradiation method and charged by applying a bias voltage between EFM tip and sample. The EFM system was used to image charged areas and to determine quantitatively the amount of stored charge in the ALI nanoparticle-inserted MIS structure. In addition, charge trapping characteristics of the samples were carried out with electrical measurements, such as capacitance-voltage and current-voltage measurement for memory characteristics. Finally, the comparison of EFM results with the electrically measured data was done to determine the amount of stored charge in the ALI nanoparticle-inserted MIS struCtUre, confirming the usefulness of EFM system for the characterization of nanoparticle-based non-volatile devices. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Electrostatic force microscopy measurements of charge trapping behavior of Au nanoparticles embedded in metal-insulator-semiconductor structure | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Hong, JinPyo | - |
dc.identifier.doi | 10.1016/j.ultramic.2008.04.041 | - |
dc.identifier.scopusid | 2-s2.0-49949118488 | - |
dc.identifier.wosid | 000259728000046 | - |
dc.identifier.bibliographicCitation | ULTRAMICROSCOPY, v.108, no.10, pp.1215 - 1219 | - |
dc.relation.isPartOf | ULTRAMICROSCOPY | - |
dc.citation.title | ULTRAMICROSCOPY | - |
dc.citation.volume | 108 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 1215 | - |
dc.citation.endPage | 1219 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Microscopy | - |
dc.relation.journalWebOfScienceCategory | Microscopy | - |
dc.subject.keywordPlus | NANOCRYSTALS | - |
dc.subject.keywordPlus | MEMORY | - |
dc.subject.keywordPlus | SIO2 | - |
dc.subject.keywordAuthor | electrostatic force microscopy | - |
dc.subject.keywordAuthor | nanoparticles | - |
dc.subject.keywordAuthor | non-volatile memory | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0304399108001095?via%3Dihub | - |
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