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Thin transparent single-crystal silicon membranes made using a silicon-on-nitride wafer

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dc.contributor.authorLee, Su Hwan-
dc.contributor.authorKim, Dal Ho-
dc.contributor.authorYang, Hee-Doo-
dc.contributor.authorKim, Sung-Jun-
dc.contributor.authorShin, Dong-Won-
dc.contributor.authorWoo, Sung Ha-
dc.contributor.authorLee, Hun Joo-
dc.contributor.authorSeung, Hyun Min-
dc.contributor.authorLee, Sarig-Keum-
dc.contributor.authorLee, Gon-Sub-
dc.contributor.authorPark, Jea-Gun-
dc.date.accessioned2022-12-21T01:46:00Z-
dc.date.available2022-12-21T01:46:00Z-
dc.date.created2022-08-26-
dc.date.issued2008-08-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178081-
dc.description.abstractWe have produced various transparent silicon membrane applications, such as solar cells, microstructures, sensors and displays by using silicon-on-nitride (SON) wafers. We first tried to make them by using silicon-on-insulator (SOI) wafers and a buried layer Of SiO2 as an etch-stop layer. However, during the wet-etching process, the buried SiO2 layer did not completely block the potassium hydroxide (KOH) etchant. The silicon membrane eventually formed micro-cracks and the membrane broke along the line of micro-cracks. Because the etching selectivity between Si and SiO2 is only 200 : 1 in 30 % KOH at 80 degrees C, the nanometer-order thickness Of SiO2 is insufficient for a suitable etch-stop layer. We have, therefore, developed a wafer that combines a dielectric etch-stop layer with a SOI wafer and that makes it possible to produce transparent silicon membranes of various thicknesses.-
dc.language영어-
dc.language.isoen-
dc.publisherKOREAN PHYSICAL SOC-
dc.titleThin transparent single-crystal silicon membranes made using a silicon-on-nitride wafer-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Jea-Gun-
dc.identifier.doi10.3938/jkps.53.579-
dc.identifier.scopusid2-s2.0-50949129156-
dc.identifier.wosid000258481300017-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.2, pp.579 - 583-
dc.relation.isPartOfJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume53-
dc.citation.number2-
dc.citation.startPage579-
dc.citation.endPage583-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART001472958-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.subject.keywordPlusETCH-STOP-
dc.subject.keywordPlusPOLYCRYSTALLINE SILICON-
dc.subject.keywordPlusBACK-
dc.subject.keywordAuthorSOI-
dc.subject.keywordAuthorSON-
dc.subject.keywordAuthoretch-stop-
dc.subject.keywordAuthorsilicon membrane-
dc.subject.keywordAuthortransparent single-crystal silicon-
dc.identifier.urlhttps://www.jkps.or.kr/journal/view.html?volume=53&number=2&spage=579&year=2008-
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