Thin transparent single-crystal silicon membranes made using a silicon-on-nitride wafer
DC Field | Value | Language |
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dc.contributor.author | Lee, Su Hwan | - |
dc.contributor.author | Kim, Dal Ho | - |
dc.contributor.author | Yang, Hee-Doo | - |
dc.contributor.author | Kim, Sung-Jun | - |
dc.contributor.author | Shin, Dong-Won | - |
dc.contributor.author | Woo, Sung Ha | - |
dc.contributor.author | Lee, Hun Joo | - |
dc.contributor.author | Seung, Hyun Min | - |
dc.contributor.author | Lee, Sarig-Keum | - |
dc.contributor.author | Lee, Gon-Sub | - |
dc.contributor.author | Park, Jea-Gun | - |
dc.date.accessioned | 2022-12-21T01:46:00Z | - |
dc.date.available | 2022-12-21T01:46:00Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2008-08 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178081 | - |
dc.description.abstract | We have produced various transparent silicon membrane applications, such as solar cells, microstructures, sensors and displays by using silicon-on-nitride (SON) wafers. We first tried to make them by using silicon-on-insulator (SOI) wafers and a buried layer Of SiO2 as an etch-stop layer. However, during the wet-etching process, the buried SiO2 layer did not completely block the potassium hydroxide (KOH) etchant. The silicon membrane eventually formed micro-cracks and the membrane broke along the line of micro-cracks. Because the etching selectivity between Si and SiO2 is only 200 : 1 in 30 % KOH at 80 degrees C, the nanometer-order thickness Of SiO2 is insufficient for a suitable etch-stop layer. We have, therefore, developed a wafer that combines a dielectric etch-stop layer with a SOI wafer and that makes it possible to produce transparent silicon membranes of various thicknesses. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.title | Thin transparent single-crystal silicon membranes made using a silicon-on-nitride wafer | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Jea-Gun | - |
dc.identifier.doi | 10.3938/jkps.53.579 | - |
dc.identifier.scopusid | 2-s2.0-50949129156 | - |
dc.identifier.wosid | 000258481300017 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.2, pp.579 - 583 | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 53 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 579 | - |
dc.citation.endPage | 583 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART001472958 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.subject.keywordPlus | ETCH-STOP | - |
dc.subject.keywordPlus | POLYCRYSTALLINE SILICON | - |
dc.subject.keywordPlus | BACK | - |
dc.subject.keywordAuthor | SOI | - |
dc.subject.keywordAuthor | SON | - |
dc.subject.keywordAuthor | etch-stop | - |
dc.subject.keywordAuthor | silicon membrane | - |
dc.subject.keywordAuthor | transparent single-crystal silicon | - |
dc.identifier.url | https://www.jkps.or.kr/journal/view.html?volume=53&number=2&spage=579&year=2008 | - |
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