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Property of a CZT Semiconductor Detector for Radionuclide Identification

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dc.contributor.authorChun, Sung-Dae-
dc.contributor.authorPark, Se-Hwan-
dc.contributor.authorLee, Dong Hoon-
dc.contributor.authorKim, Yong Kyun-
dc.contributor.authorHa, Jang Ho-
dc.contributor.authorKang, Sang Mook-
dc.contributor.authorCho, Yun Ho-
dc.contributor.authorHong, Duk-Geun-
dc.contributor.authorKim, Jong Kyung-
dc.date.accessioned2022-12-21T02:49:24Z-
dc.date.available2022-12-21T02:49:24Z-
dc.date.created2022-08-26-
dc.date.issued2008-06-
dc.identifier.issn0022-3131-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178546-
dc.description.abstractCompound semiconductors of high Z value material have been studied intensively for X-ray and gamma-ray spectroscopy at room temperature. CdZnTe has wide band gap energy as 1.6 eV and can provide high quantum efficiency with reasonably good energy resolution at room temperature. This study is aimed at determining radionuclide analysis ability by measuring energy resolution of CZT detector which will be applied at nuclear material identification purpose. For experiment we used a CZT detector (5 x 5 x 5 mm 3) which is manufactured by eV Products. We have performed our measurement at varied temperatures similar to the outdoor environment for the investigation about temperature dependence of energy resolution and peak centroid fluctuation of CZT detector by using gas cooling and Peltier cooling methods. In order to test radionuclide identification we used various radionuclide samples; plutonium, europium and other standard sources. Pulse height spectra were obtained by standard electronics which consists of a preamplifier, a shaping amplifier, and a multi-channel analyzer.-
dc.language영어-
dc.language.isoen-
dc.publisherTAYLOR & FRANCIS LTD-
dc.titleProperty of a CZT Semiconductor Detector for Radionuclide Identification-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Yong Kyun-
dc.identifier.doi10.1080/00223131.2008.10875879-
dc.identifier.scopusid2-s2.0-84881114000-
dc.identifier.wosid000267196000109-
dc.identifier.bibliographicCitationJOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, pp.421 - 424-
dc.relation.isPartOfJOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY-
dc.citation.titleJOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY-
dc.citation.startPage421-
dc.citation.endPage424-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaNuclear Science & Technology-
dc.relation.journalWebOfScienceCategoryNuclear Science & Technology-
dc.subject.keywordPlusAmplifiers (electronic)-
dc.subject.keywordPlusCadmium alloys-
dc.subject.keywordPlusEnergy gap-
dc.subject.keywordPlusGamma ray spectrometers-
dc.subject.keywordPlusGamma rays-
dc.subject.keywordPlusPulse shaping-
dc.subject.keywordPlusSemiconductor detectors-
dc.subject.keywordPlusTemperature distribution-
dc.subject.keywordPlusZ transforms-
dc.subject.keywordAuthorCdZnTe detector-
dc.subject.keywordAuthorEnergy resolution-
dc.subject.keywordAuthorPeak centroid fluctuation-
dc.subject.keywordAuthorTemperature dependence-
dc.identifier.urlhttps://www.tandfonline.com/doi/abs/10.1080/00223131.2008.10875879-
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