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Surface passivation effect on CZT-metal contact
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Se Hwan | - |
| dc.contributor.author | Ha, Han Soo | - |
| dc.contributor.author | Cho, Yoon-Ho | - |
| dc.contributor.author | Kim, Han Soo | - |
| dc.contributor.author | Kang, Sang Mook | - |
| dc.contributor.author | Kim, Yong Kyun | - |
| dc.contributor.author | Kim, Jong Kyung | - |
| dc.date.accessioned | 2022-12-21T02:53:38Z | - |
| dc.date.available | 2022-12-21T02:53:38Z | - |
| dc.date.issued | 2008-06 | - |
| dc.identifier.issn | 0018-9499 | - |
| dc.identifier.issn | 1558-1578 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178580 | - |
| dc.description.abstract | The process of cadmium zinc telluride (CZT) surface passivation is very important to reduce the leakage current of the detector and to improve the detector performance. NH4/H2O2 solution was identified as an effective passivation agent for CZT. We fabricated a CZT planar detector and measured the detector performances before and after the NH4/H2O2 passivation. For the first time, the passivation effect on CZT-metal contact was measured. The depth profile of the chemical composition of metal contact was measured with AES to understand the change of the CZT detector performance with passivation. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Surface passivation effect on CZT-metal contact | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TNS.2007.914934 | - |
| dc.identifier.scopusid | 2-s2.0-45849150064 | - |
| dc.identifier.wosid | 000256967800100 | - |
| dc.identifier.bibliographicCitation | IEEE Transactions on Nuclear Science, v.55, no.3, pp 1547 - 1550 | - |
| dc.citation.title | IEEE Transactions on Nuclear Science | - |
| dc.citation.volume | 55 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 1547 | - |
| dc.citation.endPage | 1550 | - |
| dc.type.docType | Article; Proceedings Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Nuclear Science & Technology | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
| dc.subject.keywordPlus | CADMIUM ZINC TELLURIDE | - |
| dc.subject.keywordPlus | CDZNTE DETECTORS | - |
| dc.subject.keywordPlus | PERFORMANCE | - |
| dc.subject.keywordPlus | CRYSTALS | - |
| dc.subject.keywordPlus | CDTE | - |
| dc.subject.keywordPlus | RAY | - |
| dc.subject.keywordAuthor | cadmium zinc telluride (CZT) | - |
| dc.subject.keywordAuthor | leakage current | - |
| dc.subject.keywordAuthor | metal-semiconductor contact | - |
| dc.subject.keywordAuthor | surface passivation | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/4545194 | - |
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Related Researcher
- Kim, Yong Kyun
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)