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Dependence of the distance between cut-wire-pair layers on resonance frequencies
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lam, Vu Dinh | - |
| dc.contributor.author | Kim, Jeon B. | - |
| dc.contributor.author | Tung, Nguyen Thanh | - |
| dc.contributor.author | Lee, Seong Jae | - |
| dc.contributor.author | Lee, Young Pak | - |
| dc.contributor.author | Rhee, Joo Yull | - |
| dc.date.accessioned | 2022-12-21T03:43:26Z | - |
| dc.date.available | 2022-12-21T03:43:26Z | - |
| dc.date.issued | 2008-04 | - |
| dc.identifier.issn | 1094-4087 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178818 | - |
| dc.description.abstract | We studied both experimentally and theoretically the influence of the distance between adjacent cut-wire-pair layers on the magnetic and the electric resonances in the microwave-frequency regime. Besides the dependence on the separation between cut-wire pairs, along the electric-field direction, the electric resonance strongly depends on the distance between cut-wire-pair layers, while the magnetic resonance is almost unchanged. This contrast can be understood by the difference in the distribution of induced-charge density and in the direction of the induced current between the electric and magnetic resonances. A simple model is proposed to simulate our experimental results and the simulation results are in good agreement with the experiment. This result provides important information in obtaining left-handed behavior when the cut-wire pairs are combined with the continuous wire. | - |
| dc.format.extent | 8 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Optical Society of America | - |
| dc.title | Dependence of the distance between cut-wire-pair layers on resonance frequencies | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1364/OE.16.005934 | - |
| dc.identifier.scopusid | 2-s2.0-42449092035 | - |
| dc.identifier.wosid | 000255120300088 | - |
| dc.identifier.bibliographicCitation | Optics Express, v.16, no.8, pp 5934 - 5941 | - |
| dc.citation.title | Optics Express | - |
| dc.citation.volume | 16 | - |
| dc.citation.number | 8 | - |
| dc.citation.startPage | 5934 | - |
| dc.citation.endPage | 5941 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.subject.keywordPlus | OPTICAL METAMATERIALS | - |
| dc.subject.keywordPlus | NEGATIVE-INDEX | - |
| dc.identifier.url | https://opg.optica.org/oe/fulltext.cfm?uri=oe-16-8-5934&id=157219 | - |
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