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Thermal decomposition of perfluorodecylsiloxane self-assembled monolayers in air

Authors
Seo, Eun K.Sung, Myung Mo
Issue Date
Oct-2007
Publisher
ELSEVIER SCIENCE BV
Keywords
perfluorodecylsiloxane; monolayer
Citation
ULTRAMICROSCOPY, v.107, no.10-11, pp.995 - 999
Indexed
SCIE
SCOPUS
Journal Title
ULTRAMICROSCOPY
Volume
107
Number
10-11
Start Page
995
End Page
999
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/179480
DOI
10.1016/j.ultramic.2007.02.037
ISSN
0304-3991
Abstract
The thermal decomposition of perfluorodecylsiloxane self-assembled monolayers (SAMs) in air has been studied using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and contact angle analysis. It is found that the monolayers are stable in air up to about 300 degrees C. Above 350 degrees C the monolayers primarily decompose through C-C bond cleavage, with a gradual reduction in chain length.
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