Effects of rough surface on contact depth for instrumented microindentation using spherical lndenter
- Authors
- Kim, Ju Young; Lee, Jung Jun; Lee, Yun Hee; Jang, Jae il; Kwon, Dongil
- Issue Date
- Sep-2007
- Publisher
- Trans Tech Publications Ltd
- Keywords
- Contact depth; Instrumented microindentation; Spherical indenter; Surface roughness
- Citation
- Solid State Phenomena, v.124-126, no.PART 2, pp.1337 - 1340
- Indexed
- SCOPUS
- Journal Title
- Solid State Phenomena
- Volume
- 124-126
- Number
- PART 2
- Start Page
- 1337
- End Page
- 1340
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/179587
- DOI
- 10.4028/www.scientific.net/SSP.124-126.1337
- ISSN
- 1012-0394
- Abstract
- Surface roughness is main source of error in instrumented microindentation when it is not negligible relative to the indentation depth. The effect of a rough surface on the results of instrumented microindentation testing using spherical indenter was analyzed by applying the contact depth model, which takes surface roughness into account. Improved variations in hardness and Young's modulus were shown for W and Ni when the results were analyzed by this rough-surface model, while these values were underestimated with increasing surface roughness when analyzed by the flat-surface model. The deformation state of asperities underneath spherical indenter was also discussed.
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