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Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer
- Issue Date
- Sep-2007
- Publisher
- Trans Tech Publications Ltd
- Keywords
- Au nano-crystal; Bistability; Curing; Nonvolatile memory; PBD; PVK
- Citation
- Solid State Phenomena, v.124-126, no.PART 1, pp.33 - 36
- Indexed
- SCOPUS
- Journal Title
- Solid State Phenomena
- Volume
- 124-126
- Number
- PART 1
- Start Page
- 33
- End Page
- 36
- ISSN
- 1012-0394
- Abstract
- We demonstrated a nonvolatile memory fabricated with the sandwich device structure of Al/Au nano-crystals embedded in the PVK/Al. The bi-stable conduction switching characteristic (Ion/Ioff ratio) was >1×102, depending on Au nano-crystal size. The size and distribution of Au nano-crystals were determined by the inserted Au-layer thickness between PVK layers. The size of Au nano-crystals increased with the inserted Au-layer thickness. The uniform distribution of isolated Au nano-crystals was obtained with 5 nm of the inserted Au-layer thickness.
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Related Researcher
- Park, Jea Gun
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)