Correlation between the surface roughness and the leakage current of an SSB radiation detector
DC Field | Value | Language |
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dc.contributor.author | Kim, Han Soo | - |
dc.contributor.author | Park, Se Hwan | - |
dc.contributor.author | Kim, Yong Kyun | - |
dc.contributor.author | Ha, Jang Ho | - |
dc.contributor.author | Kang, Sang Mook | - |
dc.contributor.author | Cho, Seung Yeon | - |
dc.date.accessioned | 2022-12-21T07:00:40Z | - |
dc.date.available | 2022-12-21T07:00:40Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2007-08 | - |
dc.identifier.issn | 0168-9002 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/179798 | - |
dc.description.abstract | Leakage current is one of the main noise sources of in radiation detectors, especially in a semiconductor radiation detector used for energy spectroscopy. A Silicon Surface Barrier (SSB) radiation detector was constructed to study the correlation between its surface roughness and leakage current. The surface roughness was analyzed with an Atomic Force Microscopy (AFM). All the constructed SSB radiation detectors in this study were processed in same way, but the etching solutions used to roughen the silicon surface were different. The correlation coefficient between the surface roughness and the leakage current was 0.848. This value indicates that the surface roughness and the leakage current have a relatively strong relationship, and a proper etching condition can minimize the leakage current in a semiconductor radiation detector based on silicon. The energy spectrum for an alpha particle from (238)pU was also measured with the constructed SSB radiation detector. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Correlation between the surface roughness and the leakage current of an SSB radiation detector | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Yong Kyun | - |
dc.identifier.doi | 10.1016/j.nima.2007.04.021 | - |
dc.identifier.scopusid | 2-s2.0-34547682218 | - |
dc.identifier.wosid | 000249348400030 | - |
dc.identifier.bibliographicCitation | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.579, no.1, pp.117 - 119 | - |
dc.relation.isPartOf | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.title | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | - |
dc.citation.volume | 579 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 117 | - |
dc.citation.endPage | 119 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Physics, Nuclear | - |
dc.relation.journalWebOfScienceCategory | Physics, Particles & Fields | - |
dc.subject.keywordAuthor | correlation | - |
dc.subject.keywordAuthor | silicon surface barrier | - |
dc.subject.keywordAuthor | surface roughness | - |
dc.subject.keywordAuthor | leakage current | - |
dc.subject.keywordAuthor | energy resolution | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S016890020700589X?via%3Dihub | - |
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