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Electrical study on indium-rich InGaN/GaN multi-quantum-well system

Authors
Kim, EunkyuKim, Jin-soakKwon, Soon-YongKim, Hee-jinYoon, Euijoon
Issue Date
Nov-2006
Publisher
한국물리학회
Keywords
deep-level transient spectroscopy; InGaN/GaN; quantum well; energy level
Citation
Journal of the Korean Physical Society, v.49, no.5, pp 2132 - 2135
Pages
4
Indexed
SCIE
SCOPUS
KCI
Journal Title
Journal of the Korean Physical Society
Volume
49
Number
5
Start Page
2132
End Page
2135
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/180778
ISSN
0374-4884
1976-8524
Abstract
We studied the electrical properties of a 10-period InGaN/GaN multi-quantum-well (MQW) structure by using capacitance-voltage (C-V) and deep-level transient spectroscopy (DLTS) methods. Two energy states of the InGaN QW appeared, are at about 0.37 eV and the other at 0.43 eV from the conduction band edge of the GaN barrier. Band-to-band transition energies of 3.10 eV and 3.18 eV were found by using the PL measurements. A defect with an activation energy of 0.39 eV and a cross-section of 3.96 x 10(-18) cm(2) was also found in the GaN buffer layer. The energy-band diagram of InGaN/GaN QW structure is discussed using the PL and the DLTS parameters, considering the existence of a electron capture barrier.
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