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Existence of a Cu3Au-type ordered structure in CdxZn1-xTe epilayers grown on (100)GaAs substrates
- Authors
- Lee, Hoseong; Yi, Seonghoon; Kim, Taewhan; Park, Yujin; Lee, Jeongyong; Kwon, Myoung-seok; Park, Hong-lee
- Issue Date
- Jan-2006
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Keywords
- semiconductor; transmission electron microscopy; order-disorder effects
- Citation
- SOLID STATE COMMUNICATIONS, v.137, no.1-2, pp.70 - 73
- Indexed
- SCIE
SCOPUS
- Journal Title
- SOLID STATE COMMUNICATIONS
- Volume
- 137
- Number
- 1-2
- Start Page
- 70
- End Page
- 73
- ISSN
- 0038-1098
- Abstract
- Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1-xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the Cd(x)Z(1-x)Te epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1-xTe epilayers grown on GaAs substrates.
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