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Improved Adhesion of Metal Electrode Layer on Si3N4 Substrate through an All-Wet Process

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dc.contributor.authorKim, Danbi-
dc.contributor.authorEom, Nu Si A.-
dc.contributor.authorKim, Jiwon-
dc.contributor.authorLee, Kyu Hyoung-
dc.contributor.authorPark, Sung Heum-
dc.contributor.authorLee, Ju Ho-
dc.contributor.authorChao, Yong-Ho-
dc.contributor.authorLim, Jae-Hong-
dc.date.accessioned2022-12-22T02:33:32Z-
dc.date.available2022-12-22T02:33:32Z-
dc.date.created2021-01-21-
dc.date.issued2019-03-
dc.identifier.issn2162-8769-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/182090-
dc.description.abstractElectroless deposition requires preliminary surface treatment to effectively adsorb a metal electrode layer onto a ceramic substrate. Herein, a simple surface treatment using an all-wet process was performed to achieve adhesion stability between a Si3N4 substrate and Ni film. The method involved deposition of an interfacial Pd-TiO2 buffer between the two layers. Surface pretreatment via silanization was initially performed to improve surface wettability, thereby enhancing uniform deposition of Pd-TiO2. Subsequently, a thin Ni layer was directly deposited onto the Pd-TiO2 layer without necessitating sensitization or activation. The synthesized Ni/Pd-TiO2/Si3N4 heat sink exhibited excellent adhesion property in the cross-hatch, scratch, and thermal shock tests. The mechanism of adhesion enhancement involved chemical bonding of Pd-TiO2 with the self-assembled monolayer on the substrate and reduced internal stress due to removal of residual hydrogen between the layers of the heat sink. Thus, the fabricated heat sink has a promising application in electronic devices operated at high temperatures. (C) 2019 The Electrochemical Society.-
dc.language영어-
dc.language.isoen-
dc.publisherElectrochemical Society, Inc.-
dc.titleImproved Adhesion of Metal Electrode Layer on Si3N4 Substrate through an All-Wet Process-
dc.typeArticle-
dc.contributor.affiliatedAuthorChao, Yong-Ho-
dc.identifier.doi10.1149/2.0171901jss-
dc.identifier.scopusid2-s2.0-85083983533-
dc.identifier.wosid000460343500001-
dc.identifier.bibliographicCitationECS Journal of Solid State Science and Technology, v.8, no.2, pp.159 - 164-
dc.relation.isPartOfECS Journal of Solid State Science and Technology-
dc.citation.titleECS Journal of Solid State Science and Technology-
dc.citation.volume8-
dc.citation.number2-
dc.citation.startPage159-
dc.citation.endPage164-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusMICROCHANNEL HEAT SINK-
dc.subject.keywordPlusTHERMAL-CONDUCTIVITY-
dc.subject.keywordPlusCOPPER-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusALPHA-SI3N4-
dc.subject.keywordPlusTECHNOLOGY-
dc.subject.keywordPlusTITANIUM-
dc.subject.keywordPlusETHANOL-
dc.subject.keywordPlusGLASS-
dc.subject.keywordPlusTIO2-
dc.subject.keywordAuthorElectrodeposition - electroless-
dc.subject.keywordAuthoradhesion enhancement-
dc.subject.keywordAuthorElectroless deposition-
dc.subject.keywordAuthorSi3N4 substrate-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1149/2.0171901jss-
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