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Cited 10 time in webofscience Cited 13 time in scopus
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Dynamic Logic Circuits Using a-IGZO TFTs

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dc.contributor.authorKim, Jong Seok-
dc.contributor.authorJang, Jun-Hwan-
dc.contributor.authorKim, Yong-Duck-
dc.contributor.authorByun, Jung-Woo-
dc.contributor.authorHan, Kilim-
dc.contributor.authorPark, Jin-Seong-
dc.contributor.authorChoi, Byong-Deok-
dc.date.accessioned2021-08-02T14:29:15Z-
dc.date.available2021-08-02T14:29:15Z-
dc.date.created2021-05-12-
dc.date.issued2017-10-
dc.identifier.issn0018-9383-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/18750-
dc.description.abstractPreviously reported thin-film transistor (TFT) digital logic gates are mostly static circuits. If the static logic circuits are implemented using either nMOS or pMOS technologies alone, unlike CMOS technologies, the circuits consume high power because of the steady-state current, and take large circuit area. In this paper, the dynamic logic circuits using n-type a-IGZO TFTs are proposed to resolve the power and circuit area issues. The dynamic logic circuits such as inverters and nand gates are fabricated in an amorphous indium-gallium-zinc-oxide TFT technology, and traditional static logic circuits are also implemented with the same technology for comparison purposes. The measurement results show that the proposed dynamic logic circuit consumes no steady-state current, and the circuit area is reduced by 93.1%.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleDynamic Logic Circuits Using a-IGZO TFTs-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jong Seok-
dc.contributor.affiliatedAuthorPark, Jin-Seong-
dc.contributor.affiliatedAuthorChoi, Byong-Deok-
dc.identifier.doi10.1109/TED.2017.2738665-
dc.identifier.scopusid2-s2.0-85028448444-
dc.identifier.wosid000413728700022-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.10, pp.4123 - 4130-
dc.relation.isPartOfIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.citation.titleIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.citation.volume64-
dc.citation.number10-
dc.citation.startPage4123-
dc.citation.endPage4130-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusTHIN-FILM TRANSISTORS-
dc.subject.keywordAuthorAmorphous indium-gallium-zinc-oxide thin-film transistor (a-IGZO TFT)-
dc.subject.keywordAuthordynamic logic-
dc.subject.keywordAuthorlogic circuit-
dc.subject.keywordAuthorTFTs-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8012542-
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서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

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COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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