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Mixed mode fracture toughness of epoxy molding compound/ printed circuit board interface of semiconductor packages with respect to temperature and moisture

Authors
Um, Hui-JinLee, Se-MinLee, Dae-WoongHa, SangyulKim, Hak-Sung
Issue Date
Sep-2023
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Keywords
Mixed-mode delamination; Semiconductor packages; Asymmetric double cantilever beam (ADCB); test; End notched flexure (ENF) test
Citation
ENGINEERING FRACTURE MECHANICS, v.289, pp.1 - 14
Indexed
SCIE
SCOPUS
Journal Title
ENGINEERING FRACTURE MECHANICS
Volume
289
Start Page
1
End Page
14
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/188376
DOI
10.1016/j.engfracmech.2023.109429
ISSN
0013-7944
Abstract
Interfacial delamination is a critical factor for dissimilar bi-material interfaces in terms of structural mechanical behavior and reliability. In this study, the mixed mode interfacial fracture toughness of a thin epoxy molding compound/printed circuit board bilayer with different mixities was measured via the asymmetric double cantilever beam test with a reinforced metal jig. Additionally, mode II fracture toughness properties were measured through the end notched flexure test. All tests were performed under various temperature and moisture absorption conditions below 100celcius/85 %RH. Then, a finite element simulation was performed with the cohesive zone model technique to validate the experimentally measured fracture toughness values by comparing the load-displacement curves from the experiment and simulation. Additionally, the single leg beam test and its finite element simulation were conducted and compared for validation of the measured mixed mode fracture toughness values. It was demonstrated that the developed mixed mode fracture toughness measurement method could provide accurate fracture toughness, which could effectively predict the overall load-displacement curve and damage propagation behavior.
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COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)
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