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Best Practices for Using Electrostatic Discharge Protection Techniques for Single-Event Transient Mitigation

Authors
Cho, Moon-KyuSong, IckhyunFleetwood, Zachary EKhachatrian, AniWarner, Jeffrey HBuchner, Stephen PMcMorrow, DalePaki, PaulineCressler, John D
Issue Date
Jan-2019
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Electrostatic discharge (ESD); FET-based switch; pulsed laser; RF switch; single-event transient (SET); two-photon absorption (TPA)
Citation
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.66, no.SI 1, pp.240 - 247
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume
66
Number
SI 1
Start Page
240
End Page
247
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/189736
DOI
10.1109/TNS.2018.2884127
ISSN
0018-9499
Abstract
We provide "best practices" for single-event transient (SET) mitigation using electrostatic discharge (ESD) protection techniques. We investigate the correlation between SET suppression and RF performance when ESD protection circuits for SET mitigation are combined with various RF switches. The three different single-pole single-throw (SPST) switch configurations (conventional design, floating body, and floating body/n-well) were implemented to provide insight on how to best apply dc ESD protection techniques for also achieving robust SET mitigation. Based on two-photon absorption laser experiments and RF measurements, a conventional SPST switch configuration shows relatively poor RF performance but is effective for SET mitigation due to the SET discharge current path provided by ESD protection circuit. On the other hand, the combination of the SPST switch and the ESD circuit, which exhibits the best RF performance among the three configurations, is relatively vulnerable to SETs. Based on these results, strategies and methodologies for ESD protection techniques to effectively mitigate SET are proposed.
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Song, Ickhyun
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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