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SPACE CHARGE AND RESISTANCE EFFECTS ON SATURATION OF FIELD EMISSION
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Wang, Guo-Ning | - |
| dc.contributor.author | Aranganadin, Kaviya | - |
| dc.contributor.author | Lan, Yung-Chiang | - |
| dc.contributor.author | Hsu, Hua-Yi | - |
| dc.contributor.author | Verboncoeur, John P. | - |
| dc.contributor.author | Lin, Ming-Chieh | - |
| dc.date.accessioned | 2023-09-11T01:33:04Z | - |
| dc.date.available | 2023-09-11T01:33:04Z | - |
| dc.date.created | 2023-09-04 | - |
| dc.date.issued | 2023-07 | - |
| dc.identifier.issn | 2164-2370 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/190261 | - |
| dc.description.abstract | Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | IEEE | - |
| dc.title | SPACE CHARGE AND RESISTANCE EFFECTS ON SATURATION OF FIELD EMISSION | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Lin, Ming-Chieh | - |
| dc.identifier.doi | 10.1109/IVNC57695.2023.10188956 | - |
| dc.identifier.scopusid | 2-s2.0-85168668714 | - |
| dc.identifier.wosid | 001042193300024 | - |
| dc.identifier.bibliographicCitation | 2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC, pp.72 - 73 | - |
| dc.relation.isPartOf | 2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC | - |
| dc.citation.title | 2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC | - |
| dc.citation.startPage | 72 | - |
| dc.citation.endPage | 73 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.subject.keywordAuthor | Particle-in-cell simulation | - |
| dc.subject.keywordAuthor | field emission | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/10188956 | - |
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Related Researcher
- Lin, Ming Chieh
- COLLEGE OF ENGINEERING (MAJOR IN ELECTRICAL ENGINEERING)