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SPACE CHARGE AND RESISTANCE EFFECTS ON SATURATION OF FIELD EMISSION

Authors
Wang, Guo-NingAranganadin, KaviyaLan, Yung-ChiangHsu, Hua-YiVerboncoeur, John P.Lin, Ming-Chieh
Issue Date
Jul-2023
Publisher
IEEE
Keywords
Particle-in-cell simulation; field emission
Citation
2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC, pp.72 - 73
Indexed
SCOPUS
Journal Title
2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC
Start Page
72
End Page
73
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/190261
DOI
10.1109/IVNC57695.2023.10188956
ISSN
2164-2370
Abstract
Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.
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