SPACE CHARGE AND RESISTANCE EFFECTS ON SATURATION OF FIELD EMISSION
- Authors
- Wang, Guo-Ning; Aranganadin, Kaviya; Lan, Yung-Chiang; Hsu, Hua-Yi; Verboncoeur, John P.; Lin, Ming-Chieh
- Issue Date
- Jul-2023
- Publisher
- IEEE
- Keywords
- Particle-in-cell simulation; field emission
- Citation
- 2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC, pp.72 - 73
- Indexed
- SCOPUS
- Journal Title
- 2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC
- Start Page
- 72
- End Page
- 73
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/190261
- DOI
- 10.1109/IVNC57695.2023.10188956
- ISSN
- 2164-2370
- Abstract
- Saturation of field emission under a strong applied electric field has been observed experimentally and studied theoretically for decades. Basically, the saturation can be attributed to a substrate effect characterized by a resistance or a space charge effect featured with a reduced surface electric field. In this work, a self-consistent model based on the particle-in-cell method coupled with a circuit modeling is employed to study the saturation of field emission due to these two effects in order to understand the electrical properties influenced and different characteristics caused.
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