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간섭신호의 영향에 따른 WLAN 서비스품질 측정A Measurement of WLAN Service Quality According to the Influence of Interference Signals

Other Titles
A Measurement of WLAN Service Quality According to the Influence of Interference Signals
Authors
김한석최재훈노정민송대원이상엽김근배
Issue Date
Dec-2023
Publisher
한국통신학회
Keywords
WLAN; Access Point; Channel Interference; Throughput; IEEE80211
Citation
한국통신학회논문지, v.48, no.12, pp 1593 - 1605
Pages
13
Indexed
KCI
Journal Title
한국통신학회논문지
Volume
48
Number
12
Start Page
1593
End Page
1605
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/194363
DOI
10.7840/kics.2023.48.12.1593
ISSN
1226-4717
2287-3880
Abstract
무선랜(WLAN, Wireless Local Area Network)이 서비스되는 ISM(Industrial Scientific Medical)대역은 비면허대역으로 WLAN 외에도 블루투스, 지그비 등 다양한 신호들이 존재하며 서로 간섭신호로 작용한다. WLAN의 서비스 품질은 이러한 간섭신호들 가운데 동일채널 또는 인접채널에서 동작하는 OBSS (Overlapped Basic Service Set) WLAN 신호에 의해 주로 영향을 받는다. 본 논문에서는 동일채널의 OBSS 간섭신호 영향에 따른 WLAN 서비스 품질을 정량적으로 측정하기 위하여 처리량 효율과 간섭 대응 처리율을 성능지표로 정의하고 이를 기반으로 WLAN 서비스 품질을 측정하기 위한 시험 절차를 제시한다. 또한 이를 상용 WLAN AP(Access Point)의 간섭 영향 평가시험에 적용하고 그 결과를 비교 분석함으로써 제안하는 WLAN 서비스 품질 측정 방법의 유효성을검증한다. 본 논문에서 제안하는 측정지표 및 시험 절차는 다양한 측면에서 AP제품의 성능을 비교 분석하는데 적용될 수 있다.
WLAN(Wireless local area network) is serviced in ISM(Industrial Scientific Medical) band where Bluetooth, Zigbee, and other WLAN signal coexist. They affect each other as interfering signals. Among these interference signals, WLAN service quality is mainly affected by overlapped basic service set (OBSS) WLAN signals operating on the same channel or the adjacent channels. In this paper, we define the throughput efficiency and interference robustness as performance specifications to quantitatively measure the service quality of WLAN according to the OBSS signal interference. We set up a test procedure for measuring WLAN service quality based on these specifications. In addition, we verify the effectiveness of the proposed method by applying it to the test for the commercial WLAN access points (APs) and analyzing the results. The measurement specification and test procedure proposed in this paper can be applied to product performance comparison and analysis in various aspects when evaluating the performance of APs.
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BAE, KIM GEUN
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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