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A 1.5-GS/s 6-bit Single-Channel Loop-Unrolled SAR ADC With Speculative CDAC Switching Control Technique in 28-nm CMOS

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dc.contributor.authorLee, Eunsang-
dc.contributor.authorPyo, Changhyun-
dc.contributor.author이상훈-
dc.contributor.authorHan, Jaeduk-
dc.date.accessioned2024-01-16T13:35:21Z-
dc.date.available2024-01-16T13:35:21Z-
dc.date.issued2022-10-
dc.identifier.issn1549-8328-
dc.identifier.issn1558-0806-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/194637-
dc.description.abstractThis paper presents a 1.5-GS/s 6-bit single-channel loop-unrolled successive approximation register (SAR) analog-to-digital converter (ADC) using speculative capacitive DAC (CDAC) switching control technique. The proposed SAR ADC achieves a high sampling rate by eliminating additional delays in typical loop-unrolled SAR ADCs related to settling time constraints in their CDACs. Specifically, the CDACs are duplicated and controlled in speculative ways so that the CDAC outputs passage to their next values before completing the regeneration operation of comparators, thereby improving timing constraints for successive approximations. The switching power overhead from the CDAC speculation is mitigated by introducing an energy-efficient CDAC control technique that produces desired voltage transients with minimal power overheads. The prototype of the proposed SAR ADC is fabricated in a 28-nm CMOS technology and occupies an active area of 0.0038-mm(-2) . The design consumes 5.8 mW from a 1.2-V supply. The ADC achieves 1.5-GS/s sampling frequency with a 31-dB SNDR at a low input frequency and a 28.6 dB at the Nyquist frequency without applying any offset calibration techniques, achieving the highest sampling frequency among the 6-bit single-channel loop-unrolled SAR ADCs reported.-
dc.format.extent11-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.titleA 1.5-GS/s 6-bit Single-Channel Loop-Unrolled SAR ADC With Speculative CDAC Switching Control Technique in 28-nm CMOS-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TCSI.2022.3185677-
dc.identifier.scopusid2-s2.0-85133807063-
dc.identifier.wosid000824746500001-
dc.identifier.bibliographicCitationIEEE Transactions on Circuits and Systems I: Regular Papers, v.69, no.10, pp 3954 - 3964-
dc.citation.titleIEEE Transactions on Circuits and Systems I: Regular Papers-
dc.citation.volume69-
dc.citation.number10-
dc.citation.startPage3954-
dc.citation.endPage3964-
dc.type.docTypeArticle; Early Access-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusFLASH ADC-
dc.subject.keywordPlusCALIBRATION-
dc.subject.keywordPlus10-BIT-
dc.subject.keywordPlusENERGY-
dc.subject.keywordPlusOFFSET-
dc.subject.keywordAuthorAnalog-to-digital converter (ADC)-
dc.subject.keywordAuthorloop-unrolled-
dc.subject.keywordAuthorsingle-channel-
dc.subject.keywordAuthorspeculative CDAC switching-
dc.subject.keywordAuthorsuccessive approximation register (SAR)-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9810522-
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