Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A 24.6-29.6GHz Hybrid Sub-Sampling PLL with Tri-State Integral Path Achieving 44fs Jitter and -254.8dB FOM in 28nm CMOS

Full metadata record
DC Field Value Language
dc.contributor.authorWang, Zhongkai-
dc.contributor.authorChoi, Minsoo-
dc.contributor.authorKwon, Paul-
dc.contributor.authorLiu, Zhaokai-
dc.contributor.authorYin, Bozhi-
dc.contributor.authorLee, Kyoungtae-
dc.contributor.authorPark, Kwanseo-
dc.contributor.authorBiswas, Ayan-
dc.contributor.authorHan, Jaeduk-
dc.contributor.authorDu, Sijun-
dc.contributor.authorAlon, Elad-
dc.date.accessioned2024-11-28T08:36:38Z-
dc.date.available2024-11-28T08:36:38Z-
dc.date.issued2024-05-
dc.identifier.issn0271-4310-
dc.identifier.issn0271-4310-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/195476-
dc.description.abstractWe present an LC-based hybrid sub-sampling phase-locked loop (PLL). A novel tri-state integral path is applied to reduce the loop filter (LF) area and eliminate ripples on the control signals. The effectiveness of the proposed technique is compared with type-II hybrid PLL and PLL using delta-sigma modulator. The 24.6-29.6GHz PLL instance implemented in 28-nm planar process achieves RMS jitter of 44fs and -254.8dB FOM and consumes power of 17mW from a 0.9/0.95V supply.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-
dc.titleA 24.6-29.6GHz Hybrid Sub-Sampling PLL with Tri-State Integral Path Achieving 44fs Jitter and -254.8dB FOM in 28nm CMOS-
dc.typeArticle-
dc.identifier.doi10.1109/ISCAS58744.2024.10558449-
dc.identifier.scopusid2-s2.0-85198524470-
dc.identifier.wosid001268541103030-
dc.identifier.bibliographicCitationProceedings - IEEE International Symposium on Circuits and Systems, pp 1 - 5-
dc.citation.titleProceedings - IEEE International Symposium on Circuits and Systems-
dc.citation.startPage1-
dc.citation.endPage5-
dc.type.docTypeProceedings Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Interdisciplinary Applications-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusNOISE-
dc.subject.keywordAuthor28nm-
dc.subject.keywordAuthorCMOS-
dc.subject.keywordAuthorhybrid-
dc.subject.keywordAuthorjitter-
dc.subject.keywordAuthorphase noise-
dc.subject.keywordAuthorPLL-
dc.subject.keywordAuthorsub-sampling-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10558449-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Han, Jaeduk photo

Han, Jaeduk
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE