Lightweight Error Correction for In-Storage Acceleration of Large Language Model Inference
- Authors
- Jeong, Jinwoo; Ahn, Byungmin; Shin, Dongmin; Choi, Jungwook
- Issue Date
- Jan-2024
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- error correction code; large language model; NAND flash errors
- Citation
- 2024 International Conference on Electronics, Information, and Communication, ICEIC 2024, pp 1 - 4
- Pages
- 4
- Indexed
- SCOPUS
- Journal Title
- 2024 International Conference on Electronics, Information, and Communication, ICEIC 2024
- Start Page
- 1
- End Page
- 4
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/196965
- DOI
- 10.1109/ICEIC61013.2024.10457117
- ISSN
- 2574-1403
2767-7699
- Abstract
- As large language models (LLMs) expand their sizes, conventional GPU-based LLM inference systems face memory bandwidth and capacity limitations. An LLM inference accelerator using NAND flash storage has been proposed to overcome these challenges. However, this necessitates a significant expansion of flash channels to ensure adequate bandwidth for inference, subsequently escalating error correction code (ECC) costs. This paper examines the impact of flash memory errors on LLM inference accuracy and explores the possibility of lightweight ECC by leveraging LLM's inherent error resilience. We analyze the impact of 1) high-order bit indices masking for FP32 LLM parameters, 2) clipping, and 3) a dependency by parameter type of error robustness, and show that a combination of them can reduce ECC bandwidth by up to 9.38%.
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