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Condition Monitoring Based on Bi-phase Stochastic Modeling for Manufacturing Process

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dc.contributor.author배석주-
dc.date.accessioned2024-12-02T14:30:49Z-
dc.date.available2024-12-02T14:30:49Z-
dc.date.issued2023-12-19-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/199240-
dc.titleCondition Monitoring Based on Bi-phase Stochastic Modeling for Manufacturing Process-
dc.typeConference-
dc.citation.conferenceNameIEEE International Conference on Industrial Engineering and Engineering Management (IEEM)-
dc.citation.conferencePlaceSands Expo & Convention Centre, Marina Bay Sands Singapore-
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