Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Simplified Scan-vs-BIM Frameworks for Automated Structural Inspection of Steel Structuresopen access

Authors
Kim, BoheeJo, InhoHam, NamhyukKim, Jae-jun
Issue Date
Dec-2024
Publisher
MDPI
Keywords
scan-vs-BIM; steel structure; deep learning; deep neural network (DNN); integrity evaluation; 3D scanning
Citation
Applied Sciences-basel, v.14, no.23, pp 1 - 19
Pages
19
Indexed
SCIE
SCOPUS
Journal Title
Applied Sciences-basel
Volume
14
Number
23
Start Page
1
End Page
19
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/204221
DOI
10.3390/app142311383
ISSN
2076-3417
2076-3417
Abstract
This paper presents a deep learning-based Scan-vs-BIM methodology for evaluating structural integrity through the extraction of features from As-Built scan and As-Planned Building Information Modeling (BIM) comparison data. Traditional Scan-vs-BIM frameworks often rely on Scan-to-BIM processes to generate point cloud-based mesh models for comparison, which significantly impairs computational efficiency. In contrast, the proposed streamlined Scan-vs-BIM framework incorporates a deep neural network (DNN) model consisting of two neural networks: one for structural integrity assessment and another for error type analysis. The model evaluates the structural integrity of individual components in a sequential manner, repeating the process across all elements to comprehensively assess the entire structure. Rather than converting point cloud data into mesh models for comparison, this approach directly measures the spatial discrepancies between the As-Built point cloud and As-Planned BIM, analyzing the distribution tendencies of these distance values. Experimental validation on actual steel structures demonstrated that the proposed method effectively predicts structural integrity, providing significant improvements in both accuracy and computational performance.
Files in This Item
Appears in
Collections
서울 공과대학 > 서울 건축공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE