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Photo-induced Current Transient Defect Analyses of oxide Semiconductor Materials by artificial interlligence 1D Convolutional neural networks
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍진표 | - |
| dc.date.accessioned | 2025-01-03T05:00:29Z | - |
| dc.date.available | 2025-01-03T05:00:29Z | - |
| dc.date.issued | 2024-10-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/204341 | - |
| dc.title | Photo-induced Current Transient Defect Analyses of oxide Semiconductor Materials by artificial interlligence 1D Convolutional neural networks | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2024 KPS Fall meeting | - |
| dc.citation.conferencePlace | 여수 | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)