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Results 1-1 of 1 (Search time: 0.137 seconds).
SCIE
SCOPUS
Spatial Monitoring of Wafer Map Defect Data Based on 2D Wavelet Spectrum Analysis
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open access
Lim, Munwon;
Bae, Suk Joo
Article
Issue Date
2019
Citation
APPLIED SCIENCES-BASEL, v.9, no.24, pp.1 - 10
Publisher
MDPI
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Subject
condition based maintenance
1
image processing
1
statistical process control
1
wafer bin map
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wavelet spectrum
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English
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Applied Sciences-basel
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scopus
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