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Results 1-1 of 1 (Search time: 0.007 seconds).
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SCOPUS
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects
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Kim, Seong-Joon; Kim, Man Soo;
Bae, Suk Joo
Article
Issue Date
2019
Citation
IEEE ACCESS, v.7, pp.143160 - 143168
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Kim, Seong-Joon
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Bae, Suk Joo
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DIMENSION
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Fractal structure
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NM
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OXIDE
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time-dependent dielectric breakdown
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Date Issued
2019
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English
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scopus
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