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Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests
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Park, Jong In;
Bae, Suk Joo
Article
Issue Date
2010
Citation
IEEE TRANSACTIONS ON RELIABILITY, v.59, no.1, pp.74 - 90
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Park, Jong In
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delta approximation
1
DEVICES
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INFERENCE
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INTERVAL-CENSORED-DATA
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lifetime distribution-based proce...
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MODELS
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MULTIPLE IMPUTATION
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multiple imputation
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nonlinear random-coefficients model
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organic light-emitting diode
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IEEE Transactions on Reliability
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