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A cost-driven reliability demonstration plan based on accelerated degradation tests
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Kim, Seong-Joon; Mun, Byeong Min;
Bae, Suk Joo
Article
Issue Date
2019
Citation
RELIABILITY ENGINEERING & SYSTEM SAFETY, v.183, pp.226 - 239
Publisher
ELSEVIER SCI LTD
1
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Author
Kim, Seong-Joon
1
Mun, Byeong Min
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Bae, Suk Joo
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Subject
Degradation model
1
Light-emitting diode (LED)
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MIXED EFFECTS MODELS
1
Nonlinear random-coefficients model
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POWER
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PRODUCTS
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Wiener process
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Reliability Engineering and Syste...
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