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Results 1-1 of 1 (Search time: 0.002 seconds).
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SCOPUS
Bayesian spatial defect pattern recognition in semiconductor fabrication using support vector clustering
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Yuan, Tao;
Bae, Suk Joo
; Park, Jong In
Article
Issue Date
2010
Citation
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.51, no.5-8, pp.671 - 683
Publisher
SPRINGER LONDON LTD
1
Discover
Author
Yuan, Tao
1
Subject
Bayesian inference
1
FEATURES
1
Model-based clustering
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Principal curve
1
Spatial defects
1
Spherical shell
1
Support vector clustering
1
Wafer map
1
YIELD PREDICTION
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Date Issued
2010
1
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English
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International Journal of Advanced...
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scie
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scopus
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