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SCIE
SCOPUS
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides
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Kim, Seong-Joon; Yuan, Tao;
Bae, Suk Joo
Article
Issue Date
2016
Citation
IEEE TRANSACTIONS ON RELIABILITY, v.65, no.1, pp.263 - 271
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1
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Author
Kim, Seong-Joon
1
Bae, Suk Joo
1
Yuan, Tao
1
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Competing mode
1
HARD BREAKDOWN
1
oxide breakdown
1
percolation model
1
Poisson process
1
SOFT
1
spatio-temporal point process
1
STATISTICS
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Weibull mixture
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2016
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English
1
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scie
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scopus
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