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SCIESCOPUS

Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests Go to Link

Park, Jong In; Bae, Suk Joo

ArticleIssue Date2010CitationIEEE TRANSACTIONS ON RELIABILITY, v.59, no.1, pp.74 - 90PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

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Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors Go to Link

Wang, Pingping; Tang, Yincai; Bae, Suk Joo; Xu, Ancha

ArticleIssue Date2018CitationIEEE TRANSACTIONS ON RELIABILITY, v.67, no.2, pp.688 - 700PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides Go to Link

Kim, Seong-Joon; Yuan, Tao; Bae, Suk Joo

ArticleIssue Date2016CitationIEEE TRANSACTIONS ON RELIABILITY, v.65, no.1, pp.263 - 271PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test Go to Link

Haghighi, Firoozeh; Bae, Suk Joo

ArticleIssue Date2015CitationIEEE TRANSACTIONS ON RELIABILITY, v.64, no.3, pp.960 - 971PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects Go to Link

Yuan, Tao; Ramadan, Saleem Z.; Bae, Suk Joo

ArticleIssue Date2011CitationIEEE TRANSACTIONS ON RELIABILITY, v.60, no.4, pp.729 - 741PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits Go to Link

Yuan, Tao; Bae, Suk Joo; Kuo, Yue

ArticleIssue Date2020CitationIEEE TRANSACTIONS ON RELIABILITY, v.69, no.2, pp.510 - 521PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

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