Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A Wide-Data-Range Pixel Circuit for High-Pixel-Density Mobile Displays Using Double-Gate Oxide TFTs

Full metadata record
DC Field Value Language
dc.contributor.authorLee, June-Hee-
dc.contributor.authorKim, Jin-Hyeong-
dc.contributor.authorLee, Hyeon-Ji-
dc.contributor.authorLee, Joo-Sun-
dc.contributor.authorChoi, Byong-Deok-
dc.date.accessioned2025-11-19T05:00:42Z-
dc.date.available2025-11-19T05:00:42Z-
dc.date.issued2025-06-
dc.identifier.issn0097-966X-
dc.identifier.issn2168-0159-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/209212-
dc.description.abstractFor high-pixel-density mobile displays, the pixel current should be very low, which forces the driving transistor of the pixel to operate in the subthreshold region. In this region, the data voltage range becomes very narrow, making it very challenging to accommodate 10-bit data voltages. Additionally, this results in large current deviations. The proposed circuit, composed of four TFTs and two capacitors expands the data voltage range from 1.2V to 6.5V compared to the conventional pixel circuit. This improvement is achieved by controlling the bottom gate voltage of double-gate thin-film transistors (TFTs). The expansion of data voltage range also reduces the current deviation ratio from 150.9% to 71.7% when no compensation scheme is applied.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherJohn Wiley & Sons-
dc.titleA Wide-Data-Range Pixel Circuit for High-Pixel-Density Mobile Displays Using Double-Gate Oxide TFTs-
dc.typeArticle-
dc.identifier.doi10.1002/sdtp.18469-
dc.identifier.scopusid2-s2.0-105019738024-
dc.identifier.bibliographicCitationSID Symposium Digest of Technical Papers, v.56, no.1, pp 1467 - 1470-
dc.citation.titleSID Symposium Digest of Technical Papers-
dc.citation.volume56-
dc.citation.number1-
dc.citation.startPage1467-
dc.citation.endPage1470-
dc.type.docTypeConference paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusGates (transistor)-
dc.subject.keywordPlusPixels-
dc.subject.keywordPlusStatistics-
dc.subject.keywordPlusThin film circuits-
dc.subject.keywordPlusVoltage measurement-
dc.subject.keywordAuthorAMOLED-
dc.subject.keywordAuthorcurrent deviation-
dc.subject.keywordAuthordouble-gate TFT-
dc.subject.keywordAuthorhigh-pixel-density-
dc.subject.keywordAuthorpixel circuit-
dc.subject.keywordAuthorwide data range-
dc.identifier.urlhttps://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18469-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher CHOI, BYONG DEOK photo

CHOI, BYONG DEOK
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE