Oxidation State Manipulation of NiOx for High Performance and Light-Soaking Stability of Perovskite Solar Modules
- Authors
- Yoo, Yongseok; Jung, Heesuk; Park, Hee Jeong; Kim, Jichan; Jung, Kun Soo; Lee, Hye Ryeong; Byeon, Junseop; Lee, Haram; Cho, Woosum; Kim, Sung Hoan; Baek, Se-Woong; Lee, Sungkoo; Ko, Min Jae; Seo, Gabseok; Sung, Yung-Eun; Bae, Seunghwan
- Issue Date
- Feb-2026
- Publisher
- WILEY-V C H VERLAG GMBH
- Keywords
- bilayer; light-soaking stability; Ni vacancy control; perovskite solar module; sputtering
- Citation
- SMALL METHODS, v.10, no.4, pp 1 - 13
- Pages
- 13
- Indexed
- SCIE
SCOPUS
- Journal Title
- SMALL METHODS
- Volume
- 10
- Number
- 4
- Start Page
- 1
- End Page
- 13
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/212211
- DOI
- 10.1002/smtd.202501325
- ISSN
- 2366-9608
- Abstract
- NiOx is widely used for hole-transporting layers in p-i-n-type perovskite solar cells (PSCs) due to its stability, wide bandgap (approximate to 3.5 eV), and solution processability. However, during solution processing, oxygen exposure can induce non-stoichiometry, forming Ni >= 3 +. While Ni >= 3 + enhances hole mobility, it also promotes redox reactions at the interface, undermining long-term stability. To utilize the improved mobility without sacrificing stability, bilayer NiOx films with controlled Ni >= 3 + concentrations can be fabricated. Sputtering is ideal for this, enabling precise control of oxygen partial pressure during deposition. This study utilizes sputtering to regulate Ni >= 3 + levels and optimize the ratio of two NiOx layers in bilayer films, improving charge extraction and transport. A fabricated perovskite module with a 16.0 cm2 aperture area achieves a photo-conversion efficiency (PCE) of 16.5%. Additionally, the module retains 80% of its initial PCE after 1000 h under continuous 1-sun illumination, thanks to the stable bilayer NiOx structure.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 화학공학과 > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.