Flattening Energy Puddles for Enhanced Charge Transport in Wrinkled WSe2open access
- Authors
- Park, Dae Young; Kim, Taehoon; Kim, Bora; Park, Nohyoon; Bang, Seungho; Lee, Dohyeon; Choi, Deogkyu; Kim, Dong Hyeon; Yoo, Jaekak; Lee, Seung Mi; Yu, Young Joo; Jo, Jieun; Song, Jungeun; Ko, Hayoung; Won, Yo Seob; Jeong, Takmo; Yun, Seok Joon; Kim, Ki Kang; Kim, Dong-Wook; Sung, Jooyoung; Jeong, Mun Seok
- Issue Date
- May-2026
- Publisher
- WILEY-V C H VERLAG GMBH
- Keywords
- charge carrier dynamics; femtosecond transient absorption microscopy; monolayer WSe2; trioctylphosphine selenide; wrinkle defect passivation
- Citation
- SMALL, v.22, no.28, pp 1 - 12
- Pages
- 12
- Indexed
- SCIE
SCOPUS
- Journal Title
- SMALL
- Volume
- 22
- Number
- 28
- Start Page
- 1
- End Page
- 12
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213174
- DOI
- 10.1002/smll.202514391
- ISSN
- 1613-6810
1613-6829
- Abstract
- Wrinkles, a prevalent form of line defect in monolayer (1L) 2D materials, significantly degrade their optoelectronic performance by inducing local strain, energy puddles, and charge trapping. This study introduces a wrinkle-selective strategy utilizing trioctylphosphine selenide (TOPSe), which exploits its steric hindrance and electron-donating nature to selectively heal selenium vacancies at strained wrinkle sites in 1L-WSe2. Comprehensive spectroscopic characterization—comprising Raman spectroscopy, photoluminescence spectroscopy, and femtosecond transient absorption microscopy—demonstrated substantial reductions in the defect density, suppressed non-radiative recombination, and prolonged exciton lifetimes. Kelvin probe force microscopy further revealed wrinkle-specific electron doping and spatial homogenization of the conduction band. Field-effect transistors based on TOPSe-treated 1L-WSe2 exhibited more than a two-fold increase in current and mobility, in conjunction with a transition from p-type to n-type conduction. Our findings indicate that wrinkle-targeted molecular engineering is a versatile approach for addressing intrinsic inhomogeneities in 2D materials and enabling high-performance optoelectronic devices.
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