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defect analyses of oxide semiconductor materials by photo-induced current transient spectroscopy and artificial intelligence 1D convolutional neutral networks
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍진표 | - |
| dc.date.accessioned | 2026-06-20T01:31:15Z | - |
| dc.date.available | 2026-06-20T01:31:15Z | - |
| dc.date.issued | 2025-02-13 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213467 | - |
| dc.title | defect analyses of oxide semiconductor materials by photo-induced current transient spectroscopy and artificial intelligence 1D convolutional neutral networks | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 제 32회 한국반도체 학술대회 | - |
| dc.citation.conferencePlace | 강원도 하이원 리조트 | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)