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Correlation Between Defects and Electrical Properties of Oxide Semiconductor Materials by Photo-Induced Current Transient Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍진표 | - |
| dc.date.accessioned | 2026-06-20T01:31:18Z | - |
| dc.date.available | 2026-06-20T01:31:18Z | - |
| dc.date.issued | 2025-04-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213469 | - |
| dc.title | Correlation Between Defects and Electrical Properties of Oxide Semiconductor Materials by Photo-Induced Current Transient Spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2025년 봄 학술논문발표회 | - |
| dc.citation.conferencePlace | 대전 컨벤션센터 | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)