Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Diffraction Diversity 향상을 통한 EUV Ptychography 이미지 복원 성능 개선 연구
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 안진호 | - |
| dc.date.accessioned | 2026-06-20T18:30:57Z | - |
| dc.date.available | 2026-06-20T18:30:57Z | - |
| dc.date.issued | 2026-01-28 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213643 | - |
| dc.title | Diffraction Diversity 향상을 통한 EUV Ptychography 이미지 복원 성능 개선 연구 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 33nd Korean Conference on Semiconductors | - |
| dc.citation.conferencePlace | 강원도 하이원리조트 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Ahn, Jinho
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)