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Selective Generation of CF₂ Radicals in Ar/CF₄ Plasma with a DC-Biased Grid for High-Precision Atomic Layer Etching​

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dc.contributor.author정진욱-
dc.date.accessioned2026-06-22T07:02:50Z-
dc.date.available2026-06-22T07:02:50Z-
dc.date.issued2025-06-23-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/214033-
dc.titleSelective Generation of CF₂ Radicals in Ar/CF₄ Plasma with a DC-Biased Grid for High-Precision Atomic Layer Etching​-
dc.typeConference-
dc.citation.conferenceNameALD/ALE 2025-
dc.citation.conferencePlace International Convention Center Jeju (ICC Jeju), Jeju Island, South Korea-
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