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Electrical Characteristics and Reliability Evaluation of IGZO TFTs under Hydrogen Plasma Treatement and Thermal Stress
- Authors
- 이승백
- Issue Date
- 10-Nov-2025
- Place
- Paradise Hotel Busan, Busan
- Conference Name
- The 4th Korea International Semiconductor Converence & Exhibition on Manufacturing Technology
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)